FX362 – 30 GHz TDR/Sample & Hold
The FX362B is an Analog Front End (AFE) integrated circuit for differential time-domain reflectometry step stimulus and sampling. It integrates two high-speed test and measurement functional blocks: i) a controlled-amplitude differential voltage step generator – a Time Domain Reflectometer (TDR) stimulus, and; ii) a differential, dual-rank, sample-and-hold – to digitize the reflected voltage waveform that indicates an impedance discontinuity. The F362B allows ‘combo-instruments’: with the step-generator disabled, the sample and hold amplifier (S&HA) functions as a Digital Sampling Oscilloscope (DSO) AFE, facilitating sampling of 28G NRZ or PAM4 symbol-rate eyes. The FX362B is a compact, test-instrument-on-a chip AFE delivering capability not previously integrated.
Product Description
Specifications
- Instrument Analog Front End: 100Ω
- Differential TDR step-stimulus + differential Sample & Hold
- Differential step-generation amplitude control
- Allow precision digitization of TDR step response
- Step stimulus: 10ps rise-time, amplitude to 100-700mVppd amplitude under analog control
- S&H: 30GHz analog bandwidth, 20-900MS/s S&H
- Low power dissipation, 800mW
- 2.9x2.9mm ceramic air-cavity QFN16 package
- On-chip bandgap and current references
- -5V Vee supply voltage, sampled output with common-mode supply Vddo
- Externally-set S&H output common-mode
- DC-coupled Input: 100Ω diff, 50Ω to Gnd
Applications
- Time Domain Reflectometry; impedance test
- Copper board-trace, connector, cable evaluation
- IC/system Automated Test Equipment (ATE)
- Handheld test & measurement
- Communications Systems/Backplane test
- Low Cost VNA Broadband Instrument
