FX364 – 30 GHz TDR/Sample & Hold
The FX364B is architecture/pin/function similar to the FX362B (a full-differential TDR + S&HA), with 2 exceptions: i) only aioP is driven (both aioP/aioN are terminated); ii) the FX364B peak step-stimulus is half that of FX362B.
Product Description
The FX364B is an instrumentation Analog Front End (AFE) integrated circuit for time-domain reflectometry step stimulus and sampling of single-ended transmission sub-systems. It integrates two high-speed functional blocks: i) a controlled-amplitude single-ended voltage step generator – a Time Domain Reflectometer (TDR) step-stimulus, and; ii) a differential, dual-rank, sample-and-hold – to digitize the reflected voltage waveform that indicates an impedance discontinuity. With the step-generator disabled, the sample and hold amplifier (S&HA) acts as a single Ended Digital Sampling Oscilloscope (DSO) AFE, facilitating sampling of 28G NRZ or PAM4 sample-rate eyes.
Specifications
- Instrument Analog Front End: 100Ω Single Ended TDR step-stimulus + differential Sample & Hold
- Step-generation amplitude control
Allow precision digitization of TDR step response - Step stimulus: 10ps rise-time, amplitude to 100-300mVppd amplitude under analog control
- S&H: 30GHz analog bandwidth, 20-900MS/s S&H
- Low power dissipation, 800mW
- 2.9x2.9mm ceramic air-cavity QFN16 package
- On-chip bandgap and current references
- -5V Vee supply voltage, sampled output with common-mode supply Vddo
- Externally-set S&H output common-mode
- DC-coupled, terminated, Input/Output
Application
- Time Domain Reflectometry; impedance test
- Copper board-trace, connector, cable evaluation
- IC/system Automated Test Equipment (ATE)
- Handheld test & measurement
- Communications Systems/Backplane test
